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7940

Wafer Automated Optical Inspection (AOI) Equipment by Chroma ATE Inc (2 more products)
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7940 Image

Product Specifications

Product Details

  • Part Number
    7940
  • Manufacturer
    Chroma ATE Inc

General Parameters

  • Air Supply
    6 bar
  • Camera
    25 MP
  • Cassette Load Port
    3 port
  • Chip Size
    2.2 x 2.2 mm
  • Defect Size
    1.5 µm
  • Defects
    Pad Defect, Finger Broken, Chipping, Pad Residue, Mesa Abnormality, Chip Residue, Peeling, Epi Defect, Dicing Abnormality, Pad Bump, Metal Lack, Peeling, Scratches, Emitter Defect
  • Inspection Area
    8 Inches
  • Light Source
    LED Co-Axis Light, Ring Light, Back Light
  • Magnification
    2X, 5X
  • Net Weight
    2000 kg
  • Operating Temperature
    5 to 40 Degree C
  • Overall Dimensions
    1960 x 1650 x 1750 mm
  • Power Supply
    AC 220V ± 10%, 50/60 Hz, 1F, 3 kW
  • Resolution
    1.28 µm, 0.5 µm
  • Type
    Wafer Chip Inspection
  • Wafer Size
    6 Inches

Technical Documents
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