1. Home
  2. Semiconductor Equipment
  3. Test / Inspection Equipment
  4. Wafer Automated Optical Inspection (AOI) Equipment
Filters

Wafer Automated Optical Inspection (AOI) Equipment

38 Wafer Automated Optical Inspection (AOI) Equipment for Space Applications from 17 manufacturers listed on Semiconductor Directory
  • Parametric Search
  • Download Datasheets
  • Get Quotations

Wafer Automated Optical Inspection (AOI) Equipment from the leading manufacturers are listed below. Use the filters to narrow down on products based on your requirement. Download datasheets and request quotes for products that you find interesting. Your inquiry will be directed to the manufacturer and their distributors in your region.

7945 Image
 Download Datasheet  Request Information  Product Details

Chroma ATE Inc - 7945

Wafer Automated Optical Inspection (AOI) Equipment from Chroma ATE Inc
 Download Datasheet  Request Information
Air Supply:
6 bar
Camera:
25 MP
Cassette Load Port:
2 port
Chip Size:
8 x 8 mm
Defects:
Emitter Defect, Epi Defect, Discolor, Chipping, Scratches, Outside Emitter, Backside Chipping, Finger Broken, Peeling, Finger Scratch, Epitaxy Defect,...
Light Source:
LED Co-Axis Light, Ring Light, Back Light
Magnification:
2X, 5X, 10X
Net Weight:
3000 kg
Operating Temperature:
5 to 40 Degree C
Overall Dimensions:
1900 x 1600 x 2000 mm
Power Supply:
AC 220V ± 10%, 50/60 Hz, 1F, 4.4 kW
Resolution:
1.28 µm, 0.5 µm, 0.25 µm
Type:
Wafer Die Inspection
Wafer Size:
8 Inches
more info
7940 Image
 Download Datasheet  Request Information  Product Details

Chroma ATE Inc - 7940

Wafer Automated Optical Inspection (AOI) Equipment from Chroma ATE Inc
 Download Datasheet  Request Information
Air Supply:
6 bar
Camera:
25 MP
Cassette Load Port:
3 port
Chip Size:
2.2 x 2.2 mm
Defect Size:
1.5 µm
Defects:
Pad Defect, Finger Broken, Chipping, Pad Residue, Mesa Abnormality, Chip Residue, Peeling, Epi Defect, Dicing Abnormality, Pad Bump, Metal Lack, Peeli...
Inspection Area:
8 Inches
Light Source:
LED Co-Axis Light, Ring Light, Back Light
Magnification:
2X, 5X
Net Weight:
2000 kg
Operating Temperature:
5 to 40 Degree C
Overall Dimensions:
1960 x 1650 x 1750 mm
Power Supply:
AC 220V ± 10%, 50/60 Hz, 1F, 3 kW
Resolution:
1.28 µm, 0.5 µm
Type:
Wafer Chip Inspection
Wafer Size:
6 Inches
more info
7980 Image
 Download Datasheet  Request Information  Product Details

Chroma ATE Inc - 7980

Wafer Automated Optical Inspection (AOI) Equipment from Chroma ATE Inc
 Download Datasheet  Request Information
Chuck:
12 inches wafer fixture with vacuum
Magnification:
5X, 10X, 20X, 50X (3D), 2.5X, 5X, 50X, 100X (2D)
Motorized Stage:
475 x 410 mm
Power Supply:
AC 220V ± 10%
Type:
Wafer Metrology
Wafer Size:
Up to 12 Inches
Z Drive Focus Stage:
60 mm
more info
Have a Custom Requirement?
Wafer Automated Optical Inspection (AOI) Equipment Directory