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TR7720S

Wafer Automated Optical Inspection (AOI) Equipment by Test Research, Inc (1 more product)
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Product Specifications

Product Details

  • Part Number
    TR7720S
  • Manufacturer
    Test Research, Inc

General Parameters

  • Bottom Clearance
    40 mm
  • Camera
    12 MP
  • Conveyor Height
    880 to 920 mm
  • Defects
    Missing Die, Orientation, Shift, Rotation, Chipping, Scratch, Crack, Epoxy on Die
  • Inspection Speed
    10.3 cm²/sec
  • Light Source
    Multi-phase True Color LED, Coaxial Lighting
  • Net Weight
    710 kg
  • Overall Dimensions
    750 x 1460 x 1700 mm
  • Resolution
    5.5 µm
  • Top Clearance
    25 mm
  • Top Edge Clearance
    3 mm
  • Type
    Wafer Die Inspection & Wafer Wire Bond Inspection

Technical Documents
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